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< =><=#>Shenzhen Yizhu Electronics Co., Ltd.
Address: Taoyuan Commercial Building, Guangqian Industrial Zone, Longzhu 3rd Road, Xili, Nanshan District, Shenzhen,>
Building,>< br/>Room
Contact person: Songti>Zeng Qilin
,
Telephone: ,>
Fax: ,>
,>
: ,>
<=# =>Shenzhen Yizhu Electronics Co., Ltd. will introduce to you in detail:
Tektronix r> c
High voltage differential prober> c
Differential probe/attenuation bandwidth Shenzhen
. : Tektronix High Voltage Differential Probe & Features and Benefits
: Excellent Electronic Performance
: b > & and& probe bandwidth
b> &&& Differential input capacitance
b> && Differential input capacitance
b> & (DC + Peak AC) differential input voltage
b> &&B&R ( & attenuation)
b> Selectable bandwidth limiting filter
b> DC suppression
: Universal connection
: b> Compact probe head for probing small geometric circuit components Part
b> Straight pin, square pin, welding, variable point pitch standard accessories
b> Powerful reliability design
: Easy to use
: b> Realized on the oscilloscope screen Automatic unit scaling and readouts
b> ,
c> b> Connect directly to oscilloscopes with & probe interface
b> Easily access the oscilloscope display probe menu for probe setup control and operating status information
b> Remote B/probe control via oscilloscope
b> Auto-zero output offset zeroing
b>
c> b> Connect & interface oscilloscope directly, or use CB adapter connection&r&oscilloscope
: Application
: b> High-speed switch mode power supply design
b> C-bus design
b> High-speed digital design
b> Digital design and Qualification
b> Production Engineering Test
b> Research and Development
b>
b> , and high voltage differential probes provide the design needs of today's switch mode power supplies, C-bus and high speed digital systems Excellent high-speed electronic and mechanical performance.
b> Specifically designed for direct connection to an oscilloscope via the & probe interface or the B interface. , and high-voltage differential probes enable high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
: b> Superior electronic performance
b> Universal connectivity to the device under test
b> Ease of use
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