Product Details
Microsoft Yahei: >B high-precision line width and line spacing automatic measuring instrument
Microsoft Yahei: >
Microsoft Yahei: >System interface homepage
Microsoft Yahei: >
Microsoft Yahei: >System measurement function interface
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: > b>With multi-layer high-density circuit boards The development
b>,
b>Customers' requirements for electrical characteristics continue to increase. How to control line width to ensure that the impedance meets the requirements has become a problem that each manufacturer must face
Microsoft Yahei: > b>Traditionally, the measurement of the wire width and line spacing on the B board requires skilled operators to use a tool microscope with multiple times. The operator must be very careful to calculate these thin wires to avoid errors
b>as well as the impact of light on the human eye and the impact of burrs, resulting in different measurement results by different people during eyepiece measurement
b>Big error,
b>Left and right
b>The simultaneous operation time cannot be too long, otherwise the eyes will easily tire. At the same time, since the way of boundary judgment differs from person to person, it is easy for different operators to have different measurement results. Even due to fatigue factors, the measurement results of an operator at different times will be different, resulting in unreliable results.
Microsoft Yahei: > b> It can be seen from the above that although the process capability can meet the requirements , but due to the large error
b> of personnel measurement,
b> it will be
b> unable to guarantee that the product line width is within the specification range.
Microsoft Yahei>
Microsoft Yahei: > b>Automatic line width and line spacing
b>Measurement
b>Instrument
B b>Can
b>Provide the best product quality
Microsoft Yahei: >B b>It is customized for the process control, quality assurance and other needs of factory B’s impedance line width
b>< br/> b> and high-magnification lens
b>,
b> The lens group is equipped with a higher depth of field to minimize the possibility of manual focus adjustment, and is equipped with a five-stage zoom The system's high-contrast, high-resolution images are paired with computer automatic edge finding to avoid
b> errors caused by manual point selection
b>, improve the machine's measurement speed and repeat measurement accuracy, and It can automatically measure the line width and line spacing of the upper and lower frames at the same time,
b>Solve the problem of burr measurement and calculation
b>,
b>The etched edges can be clearly viewed, Provided for etching process evaluation.
b>The measurement speed is fast and the production efficiency is high. This machine is equipped with an advanced working computer and can automatically find edges, thus greatly improving the measurement speed
b>,
b>It is different from other Due to product limitations, the machine does not need to be rotated to a specific angle to measure. The measurement results of the machine can be saved as files in plain text format. Customers can easily analyze the measurement results through various analysis software. In addition, the machine is also equipped with a control function, which can be of great help in process control. The simple machine and software operation interface can be operated online without long-term education and training, so as to meet the comfort and convenience of long-term operators. Sex
Microsoft Yahei>
Microsoft Yahei: > b> What can be measured by the line width and line distance automatic measuring instrument:
Microsoft Yahei: >
Microsoft Yahei: > b>Inner layer board
b>Outer layer board
b>br> b>Green paint board
b>br> b>Blind hole
b>br> b> Negative film
Microsoft Yahei>
Microsoft Yahei: > b>Line width and line distance automatic measuring instrument system
b>Introduction:
Microsoft Yahei>Gray gradient change algorithm Automatic edge finding and measurement
Microsoft Yahei> Can eliminate errors caused by light source changes or uneven reflection
Microsoft Yahei: > b>Automatic
b>
b >Manual measurement switching
Microsoft Yahei>The laser system quickly finds the point, which is convenient to find the point
Microsoft Yahei>The image capture device inputs the real-time image to be measured and can store the image.
Microsoft Yahei>Different operators at different times can obtain stable measurement data
Microsoft Yahei>
Microsoft Yahei: >B b>Line width and line spacing automatic measuring instrument system
b >Function:
Microsoft Yahei: > b>
Microsoft Yahei: > b>.
b> Automatic edge finding and measurement of line width and line spacing at the top and bottom
Microsoft Yahei : > b>.
b>Automatic edge finding and measurement of line width and line distance
Microsoft Yahei: > b>.
b>Automatic and manual finding of points and lines
b >Edge
b>Vertical distance measurement:
Microsoft Yahei: > b>.
b>Automatic and manual point and line finding
b>Edge
b >Shortest distance measurement:
Microsoft Yahei: > b>.
b>Circle diameter measurement
Microsoft Yahei: > b>.
b>Specify position line width Measurement
Microsoft Yahei: > b>.
b>Specified coordinate line width measurement
Microsoft Yahei: > b>.
b>Control
Microsoft Yahei: > b>.
b>Measurement statistics
Microsoft Yahei: > b>.
b>Export measurement images and results to
b>r r
Microsoft Yahei: > b>.
b>Export measurement images and results to
b>r
Microsoft Yahei: > b>.
b >.
b>Measurement system color
b>Can be arbitrarily
b>changed
Microsoft Yahei: > b>
b>. Measurement result unit selection and conversion
Microsoft Yahei: >
Microsoft Yahei: >1. Automatic edge-finding measurement function for line width and line spacing in upper and lower widths
Microsoft Yahei: >Automatic line measurement Up and down, automatically calculate the average distance, maximum distance, minimum distance and standard deviation value of the line section:
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >2. Automatic edge detection and measurement function of line width and distance
Microsoft Yahei: >Automatic edge detection and measurement of line width and distance, automatic calculation of average distance, maximum distance, minimum distance and standard deviation value of line section:
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >3. Point-to-line vertical distance measurement function
Microsoft Yahei: >Automatic and manual edge-finding vertical distance measurement between points and lines:
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >4. Circle-to-line distance measurement function
Microsoft Yahei: >Automatic and manual edge finding shortest distance measurement between points and lines:
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >5. Circle diameter measurement function
Microsoft Yahei: >Measurement or hole diameter:
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Microsoft Yahei: >6. Specified position line width measurement function
Microsoft Yahei: > Arbitrarily specify the distance between two lines, automatically calculate the average distance, maximum distance, minimum distance and standard deviation value of the line section:
Microsoft Yahei Black: >
Microsoft Yahei: >
Microsoft Yahei: >7. Specified coordinate line width measurement function
Microsoft Yahei: > Arbitrarily specify the coordinates of two lines for line width measurement, and automatically calculate the average distance, maximum distance, minimum distance and standard deviation value of the line section:
Microsoft Yahei: >
Microsoft Yahei: >Eight control functions
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Microsoft Yahei: >
Microsoft Yahei: >Nine. Measurement statistics function
Microsoft Yahei: >Record measurement projects. Date, time, measurement value
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Microsoft Yahei: >
Microsoft Yahei: >10. System measurement result output function
Microsoft Yahei: >Export measurement images and results to r
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >11. System r measurement result output function
Microsoft Yahei: >Export measurement images and results to r r
Microsoft Yahei: >
Microsoft Yahei: >12. Measurement system color change function
Microsoft Yahei: >The marking line color can be set freely
Microsoft Yahei: >
Microsoft Yahei: >
Microsoft Yahei: >Thirteen . Measurement result unit selection and conversion
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