High-temperature piezoelectric measurement system-Supply of Bailibo high-temperature piezoelectric measurement system

We supply high-temperature piezoelectric measurement systems. Bailibo high-temperature piezoelectric measurement systems are sold directly from the manufacturer. They are cost-effective and of excellent quality. Welcome to call us for consultation.
High-temperature piezoelectric measurement system series, the first high-temperature piezoelectric measurement system in China is about to be launched! -The high-temperature piezoelectric measurement system is the first domestic piezoelectric measurement equipment independently developed by Bailibo.
The world's leading materials characterization and measurement company is proud to introduce a new generation series of high-temperature piezoelectric measurement systems.
Technical parameters
Measuring temperature: room temperature ~ ℃
Temperature control accuracy: ℃, temperature measurement accuracy: .℃
Temperature rise slope: -℃/(controllable)
Cooling slope: -℃/(controllable)
Longitudinal piezoelectric coefficient test range:
High range, precision, load
Low range, precision., load
Measurement frequency:< br/> Frequency range, step: Accuracy: . (Calibration frequency:)
Polarity display: Displays the polarity of the upward side of the pressed material (indicating the negative pole)
Static force: . (at the frequency of time)
Response time
Sample:
The high-temperature piezoelectric temperature spectrum measurement system is mainly composed of a voltage measuring instrument, a high-temperature measuring furnace, a fixture and measurement software, and displays the constant temperature spectrum curve directly on the instrument. picture. There are no special requirements for the size and shape of the sample. Discs, rings, tubes, squares, strips, cylinders, and hemispherical shells can all be measured. They can be widely used in ferroelectric and piezoelectric materials (piezoelectric ceramics, high-voltage ceramics, etc.) molecules) and evaluation and testing of related device performance.