Low price rental/sale IQxel-80|IQxel-160 (Yifuda Instrument

|Wireless connection tester
br/> br/> Tebot|Wireless connection tester
br/> The machine capability test system can provide physical testing of (.) and Bluetooth () devices covering a complete range. layer testing. It exceeds the strict bandwidth requirements and error vector amplitude requirements of the equipment, and can provide specific versions.
br/>A stand-alone system that meets all major connectivity standards
br/>A single tester covers major connectivity standards such as...,... and Bluetooth.
br/> Supports all channel bandwidth combinations and versions.
br/> Dynamic analog fundamental frequency and signals can be used for transmitting and receiving purposes.
br/> A comprehensive test solution
br/> Real (multiple input, multiple output) technology testing can be achieved by using independent signals from multiple synchronized devices.
br/> Using a flexible architecture, the demand can be expanded from demand (single device) to multiple devices as the order quantity increases.
br/> Process Optimization
br/> Providing fully calibrated connections for all devices, simplifying the manufacturing testing of multiple devices and achieving the highest measurement accuracy.
br/>Simple elevated chassis saves space in the equipment rack.
br/>Deploying fully integrated processing reduces data transfer time and allows management without the need to install external controllers and software libraries.
>
Application scope
br/> Bluetooth chipset verification
br/> Router and wireless base station
br/> Block and network adapter
br/> Bluetooth (System-in-Package) Devices
br/> Tablets and Smartphones
>
Dots
br/> Designed for Manufacturing Environments
br/> The first stand-alone tester designed specifically for devices, it is an automated test solution that can be easily deployed in strict mass production devices. It adopts a streamlined elevated chassis, does not require external processing, and uses standard Ethernet connection. It has an independent network graphical user interface and compatible control commands of the built-in operating system, which can provide the fastest and easiest factory testing function. Delivers maximum throughput with native dual connectivity, eliminating the need to connect external components that can reduce the accuracy of the manufacturing environment and cause reliability issues. The second version can be used to test two bandwidth devices, doubling the device testing capacity of the test station and further saving operating costs.
br/> User Reliability
br/> Test equipment is used by most well-recognized manufacturers of high-volume test connection devices. The number of devices tested to date has exceeded 100 million. It also extends measurement reliability and customer trust to newer devices. Supported by local personnel in key manufacturing centers around the world, real-time customer support and equipment service are available when necessary. A library of multiple chipset test solutions ensures customers have access to suite of software solutions for advanced connectivity chipset solutions from leading suppliers of calibration and verification.
br/> Seamless conversion of .testers to .test
br/> Reuse existing test scripts and software from industry-standard/Bluetooth testers (including, and Bluetooth). It can quickly and easily switch to .test, while ensuring that the previous ./test program can be executed on it without having to rewrite the software. Users can easily migrate systems and test new devices while using previously written test programs or an extensive library of chipset calibration and verification software. Allows users to choose to develop test software in the /++ environment or using the programmable instrument standard command interface. The interface provides an operating system-agnostic interface that can easily communicate with scripting languages, such as those executed under , or . Graphical programming is also supported in other languages using the available software libraries provided.
>
Technical indicators
br/> Into frequency range
br/>
br/>
br/>
br/> Large Input power
br/> Peak value
br/> Average value
br/> Output power range
br/>
br/> Output power accuracy
br/> .()
br/> Technology
br/> .or
br/>
br/> Control interface
br/> (Ethernet ),
br/> Program interface,
>